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This textbook presents the first systematic exposition of the new X-ray optics. Once limited to electronic density, the X-ray reflectivity method now detects magnetic and electronic depth-profiles. It develops the theory for students, postgraduates, and researchers.
This textbook presents the first systematic exposition of the new X-ray optics. Once limited to electronic density, the X-ray reflectivity method now detects magnetic and electronic depth-profiles. It develops the theory for students, postgraduates, and researchers.
View more
This product has multiple variants. The options may be chosen on the product page