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This is the first book to present the direct method for solving inverse problems in X-ray spectroscopy, scattering, tomography, and reflectometry. It discusses the theory for multilayer structures and the phase problem in electron structural crystallography.
This is the first book to present the direct method for solving inverse problems in X-ray spectroscopy, scattering, tomography, and reflectometry. It discusses the theory for multilayer structures and the phase problem in electron structural crystallography.
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This product has multiple variants. The options may be chosen on the product page